STN EN IEC 63185
| Name: | STN EN IEC 63185 |
| Validity: | Valid |
| Number of pages: | 20 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Meranie komplexnej permitivity nízkostratových dielektrických podložiek metódou symetrického kruhového diskového rezonátora |
| English title | Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method |
| Release Date: | 01. 06. 2021 |
| Date of withdrawal: | |
| ICS: | 33.120.30 |
| Sorting character/National clasification code | 35 3815 |
| Level of incorporation: | idt EN IEC 63185:2021, idt IEC 63185:2020 |
| Official Journal | 05/21 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: | IEC 63185:2020 relates to a measurement method for complex permittivity of a dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes is taken into account accurately on the basis of the mode-matching analysis. |
| Preview: | Náhľad normy (PDF) |