STN EN IEC 63185
| Označenie: | STN EN IEC 63185 |
| Platnosť: | Platná |
| Počet strán: | 20 |
| Jazyk: |
EN
|
| Listinná verzia: | 14,10€ |
| Elektronická verzia: |
a) Bez možnosti tlače, prenosu textu a obrázkov:
12,69€ b) Bez možnosti tlače, s prenosom textu a obrázkov: 14,10€ c) S možnosťou tlače, prenosu textu a obrázkov: 18,33€ |
| Slovenský názov: | Meranie komplexnej permitivity nízkostratových dielektrických podložiek metódou symetrického kruhového diskového rezonátora |
| Anglický názov: | Measurement of the complex permittivity for low-loss dielectric substrates balanced-type circular disk resonator method |
| Dátum vydania: | 01. 08. 2025 |
| Dátum zrušenia: | |
| ICS: | 33.120.30 |
| Triediaci znak: | 35 3815 |
| Úroveň zapracovania: | idt IEC 63185:2025, idt EN IEC 63185:2025 |
| Vestník: | 07/25 |
| Zmeny: | |
| Nahradzujúce normy: | |
| Nahradené normy: | STN EN IEC 63185:2021-06 (35 3815) |
| Poznámka vo Vestníku: | |
| Predmet normy: | IEC 63185:2025 relates to a measurement method for complex permittivity of dielectric substrates at microwave and millimeter-wave frequencies. This method has been developed to evaluate the dielectric properties of low-loss materials used in microwave and millimeter-wave circuits and devices. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband measurements of dielectric substrates by using one resonator, where the effect of excitation holes and that of fringing fields are taken into account accurately on the basis of the mode-matching analysis. This second edition cancels and replaces the first edition published in 2020. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition: a) the upper limit of the applicable frequency range has been extended from 110 GHz to 170 GHz; b) circular disk resonators used for the measurements now include one with waveguide interfaces; ... |
| Náhľad normy: | Náhľad normy (PDF) |