STN EN 60749-38
| Name: | STN EN 60749-38 |
| Validity: | Valid |
| Number of pages: | 17 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 38: Softvérová skúšobná metóda chýb polovodičových súčiastok s pamäťou |
| English title | Semiconductor devices - Mechanical and climatic test methods - Part 38: Soft error test method for semiconductor devices with memory |
| Release Date: | 01. 01. 2009 |
| Date of withdrawal: | |
| ICS: | 31.080.01 |
| Sorting character/National clasification code | 35 8799 |
| Level of incorporation: | idt IEC 60749-38:2008, idt EN 60749-38:2008 |
| Official Journal | 12/08 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: |