STN EN IEC 60749-13
| Name: | STN EN IEC 60749-13 |
| Validity: | Valid |
| Number of pages: | 22 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 13: Soľná atmosféra |
| English title | Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere |
| Release Date: | 01. 02. 2019 |
| Date of withdrawal: | |
| ICS: | 31.080.01 |
| Sorting character/National clasification code | 35 8799 |
| Level of incorporation: | idt EN IEC 60749-13:2018, idt IEC 60749-13:2018 |
| Official Journal | 01/19 |
| Amendments | |
| Replaced by: | |
| Repleces: | STN EN 60749-13:2003-02 (35 8799) |
| Note in Official Journal: | |
| Subject of the standard: | IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all exposed surfaces. It is only applicable to those devices specified for a marine environment. The salt atmosphere test is considered destructive. This edition includes the following significant technical changes with respect to the previous edition: a) alignment with MIL-STD-883J Method 1009.8, Salt Atmosphere (Corrosion), including information on conditioning and maintenance of the test chamber and mounting of test specimens (including explanatory figures). |
| Preview: | Náhľad normy (PDF) |