STN EN IEC 60444-6
| Označenie: | STN EN IEC 60444-6 |
| Platnosť: | Platná |
| Počet strán: | 28 |
| Jazyk: |
EN
|
| Listinná verzia: | 14,10€ |
| Elektronická verzia: |
a) Bez možnosti tlače, prenosu textu a obrázkov:
12,69€ b) Bez možnosti tlače, s prenosom textu a obrázkov: 14,10€ c) S možnosťou tlače, prenosu textu a obrázkov: 18,33€ |
| Slovenský názov: | Meranie parametrov kremenných kryštálových jednotiek. Časť 6: Meranie závislosti na úrovni budenia (DLD) |
| Anglický názov: | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
| Dátum vydania: | 01. 01. 2022 |
| Dátum zrušenia: | |
| ICS: | 31.140 |
| Triediaci znak: | 35 8490 |
| Úroveň zapracovania: | idt EN IEC 60444-6:2021, idt IEC 60444-6:2021 |
| Vestník: | 12/21 |
| Zmeny: | |
| Nahradzujúce normy: | |
| Nahradené normy: | STN EN 60444-6:2014-02 (35 8490) |
| Poznámka vo Vestníku: | |
| Predmet normy: | This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). |
| Náhľad normy: | Náhľad normy (PDF) |