STN EN IEC 63215-2
| Name: | STN EN IEC 63215-2 |
| Validity: | Valid |
| Number of pages: | 32 |
| Language: |
EN
|
| Paper: | 17,20€ |
| Electronic version |
a) Only read (without ability to print and copy)
15,48€ b) Without ability to print, with ability to copy (printscreen) 17,20€ c) With ability to print and copy (printscreen) 22,36€ |
| Slovak title | Metódy testovania odolnosti materiálov na pripevnenie matríc. Časť 2: Metóda testovania tepelným cyklom pre materiály aplikované na výkonových elektronických súčiastkách |
| English title | Endurance test methods for die attach materials - Part 2: Temperature cycling test method for die attach materials applied to discrete type power electronic devices |
| Release Date: | 01. 02. 2024 |
| Date of withdrawal: | |
| ICS: | 31.190 |
| Sorting character/National clasification code | 34 6524 |
| Level of incorporation: | idt EN IEC 63215-2:2023, idt IEC 63215-2:2023 |
| Official Journal | 01/24 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: | IEC 63215-2:2023 applies to the die attach materials and joining system applied to discrete type power electronic devices. This document specifies the temperature cycling test method which takes into account the actual usage conditions of discrete type power electronic devices to evaluate reliability of the die attach joint materials and joining system, and establishes a classification level for joining reliability (reliability performance index). The test method specified in this document is not intended to evaluate power semiconductor devices themselves. The test method specified in this document is not regarded as the one for use to guarantee the reliability of the power semiconductor device packages. NOTE The test result obtained using this document will not be used as absolute quantitative data, but for intercomparison with the other die attach materials results using the same setup. |
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