STN 35 6575
| Name: | STN 35 6575 |
| Validity: | Valid |
| Number of pages: | 68 |
| Language: |
CS
|
| Paper: | 17,20€ |
| Electronic version |
a) Only read (without ability to print and copy)
15,48€ b) Without ability to print, with ability to copy (printscreen) 17,20€ c) With ability to print and copy (printscreen) 22,36€ |
| Slovak title | Spektrometre energií žiarenia X s polovodičovými detektormi. Metódy skúšania |
| English title | Standard test procedures for semiconductor X-ray energy spectrometers |
| Release Date: | 14. 03. 1991 |
| Date of withdrawal: | |
| ICS: | 17.240 |
| Sorting character/National clasification code | 35 6575 |
| Level of incorporation: | eqv IEC 60759:1983 |
| Official Journal | 12/91 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: |