STN EN 62979
| Name: | STN EN 62979 |
| Validity: | Valid |
| Number of pages: | 22 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Skúška tepelného prierazu premosťovacej diódy fotovoltického modulu |
| English title | Photovoltaic module - Bypass diode - Thermal runaway test |
| Release Date: | 01. 08. 2018 |
| Date of withdrawal: | |
| ICS: | 27.160 |
| Sorting character/National clasification code | 33 3432 |
| Level of incorporation: | idt IEC 62979:2017, idt EN 62979:2017 |
| Official Journal | 07/18 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: | This document provides a method for evaluating whether a bypass diode as mounted in the module is susceptible to thermal runaway or if there is sufficient cooling for it to survive the transition from forward bias operation to reverse bias operation without overheating. ... |
| Preview: | Náhľad normy (PDF) |