STN EN IEC 60749-17
| Name: | STN EN IEC 60749-17 |
| Validity: | Valid |
| Number of pages: | 16 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 17: Neutrónové žiarenie |
| English title | Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation |
| Release Date: | 01. 10. 2019 |
| Date of withdrawal: | |
| ICS: | 31.080.01 |
| Sorting character/National clasification code | 35 8799 |
| Level of incorporation: | idt EN IEC 60749-17:2019, idt IEC 60749-17:2019 |
| Official Journal | 09/19 |
| Amendments | |
| Replaced by: | |
| Repleces: | STN EN 60749-17:2003-11 (35 8799) |
| Note in Official Journal: | |
| Subject of the standard: | IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits and discrete semiconductor devices and is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: a. updates to better align the test method with MIL-STD 883J, method 1017, including removal of restriction of use of the document, and a requirement to limit the total ionization dose; b.addition of a Bibliography, including US MIL- and ASTM standards relevant to this test method. |
| Preview: | Náhľad normy (PDF) |