STN EN IEC 60749-18
| Name: | STN EN IEC 60749-18 |
| Validity: | Valid |
| Number of pages: | 27 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 18: Ionizujúce vyžarovanie (celková dávka) |
| English title | Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) |
| Release Date: | 01. 10. 2019 |
| Date of withdrawal: | |
| ICS: | 31.080.01 |
| Sorting character/National clasification code | 35 8799 |
| Level of incorporation: | idt EN IEC 60749-18:2019, idt IEC 60749-18:2019 |
| Official Journal | 09/19 |
| Amendments | |
| Replaced by: | |
| Repleces: | STN EN 60749-18:2003-10 (35 8799) |
| Note in Official Journal: | |
| Subject of the standard: | IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: - updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing; |
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