STN EN IEC 60749-18
| Označenie: | STN EN IEC 60749-18 |
| Platnosť: | Platná |
| Počet strán: | 27 |
| Jazyk: |
EN
|
| Listinná verzia: | 14,10€ |
| Elektronická verzia: |
a) Bez možnosti tlače, prenosu textu a obrázkov:
12,69€ b) Bez možnosti tlače, s prenosom textu a obrázkov: 14,10€ c) S možnosťou tlače, prenosu textu a obrázkov: 18,33€ |
| Slovenský názov: | Polovodičové súčiastky. Mechanické a klimatické skúšobné metódy. Časť 18: Ionizujúce vyžarovanie (celková dávka) |
| Anglický názov: | Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose) |
| Dátum vydania: | 01. 10. 2019 |
| Dátum zrušenia: | |
| ICS: | 31.080.01 |
| Triediaci znak: | 35 8799 |
| Úroveň zapracovania: | idt EN IEC 60749-18:2019, idt IEC 60749-18:2019 |
| Vestník: | 09/19 |
| Zmeny: | |
| Nahradzujúce normy: | |
| Nahradené normy: | STN EN 60749-18:2003-10 (35 8799) |
| Poznámka vo Vestníku: | |
| Predmet normy: | IEC 60749-18:2019 is available as IEC 60749-18:2019 RLV which contains the International Standard and its Redline version, showing all changes of the technical content compared to the previous edition.IEC 60749-18:2019 provides a test procedure for defining requirements for testing packaged semiconductor integrated circuits and discrete semiconductor devices for ionizing radiation (total dose) effects from a cobalt-60 (60Co) gamma ray source. Other suitable radiation sources can be used. This document addresses only steady-state irradiations, and is not applicable to pulse type irradiations. It is intended for military- and aerospace-related applications. It is a destructive test. This edition includes the following significant technical changes with respect to the previous edition: - updates to subclauses to better align the test method with MIL-STD 883J, method 1019, including the use of enhanced low dose rate sensitivity (ELDRS) testing; |
| Náhľad normy: | Náhľad normy (PDF) |