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STN EN IEC 61788-17

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Name: STN EN IEC 61788-17
Validity: Valid
Number of pages: 48
Language:
EN
Paper: 18,90€
Electronic version a) Only read (without ability to print and copy) 17,01€
b) Without ability to print, with ability to copy (printscreen) 18,90€
c) With ability to print and copy (printscreen) 24,57€
Slovak title Supravodivosť. Časť 17: Merania elektronických charakteristík. Lokálna kritická prúdová hustota a jej distribúcia vo veľkoplošných supravodivých vrstvách
English title Superconductivity - Part 17: Electronic characteristic measurements - Local critical current density and its distribution in large-area superconducting films
Release Date: 01. 09. 2021
Date of withdrawal:
ICS: 17.220.20, 29.050
Sorting character/National clasification code 34 5685
Level of incorporation: idt EN IEC 61788-17:2021, idt IEC 61788-17:2021
Official Journal 08/21
Amendments
Replaced by:
Repleces: STN EN 61788-17:2013-09 (34 5685)
Note in Official Journal:
Subject of the standard: IEC 61788-17:2021 specifies the measurements of the local critical current density (Jc) and its distribution in large-area high-temperature superconducting (HTS) films by an inductive method using third-harmonic voltages. The most important consideration for precise measurements is to determine Jc at liquid nitrogen temperatures by an electric-field criterion and obtain current-voltage characteristics from its frequency dependence. Although it is possible to measure Jc in applied DC magnetic fields [20] [21], the scope of this document is limited to the measurement without DC magnetic fields. This technique intrinsically measures the critical sheet current that is the product of Jc and the film thickness d. The range and measurement resolution for Jcd of HTS films are as follows. - Jcd: from 200 A/m to 32 kA/m (based on results, not limitation). - Measurement resolution: 100 A/m (based on results, not limitation).
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