STN EN IEC 60444-6
| Name: | STN EN IEC 60444-6 |
| Validity: | Valid |
| Number of pages: | 28 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Meranie parametrov kremenných kryštálových jednotiek. Časť 6: Meranie závislosti na úrovni budenia (DLD) |
| English title | Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) |
| Release Date: | 01. 01. 2022 |
| Date of withdrawal: | |
| ICS: | 31.140 |
| Sorting character/National clasification code | 35 8490 |
| Level of incorporation: | idt EN IEC 60444-6:2021, idt IEC 60444-6:2021 |
| Official Journal | 12/21 |
| Amendments | |
| Replaced by: | |
| Repleces: | STN EN 60444-6:2014-02 (35 8490) |
| Note in Official Journal: | |
| Subject of the standard: | This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-5, can be used in the complete frequency range covered by this part of IEC 60444. “Reference Method B”, based on the π-network or reflection method according to IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. “Method C”, an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions. NOTE The measurement methods specified in this document are not only applicable to AT-cut, but also to other crystal cuts and vibration modes, such as doubly rotated cuts (IT,SC) and to tuning fork crystal units (by using a high impedance test fixture). |
| Preview: | Náhľad normy (PDF) |