STN EN IEC 62276
| Označenie: | STN EN IEC 62276 |
| Platnosť: | Platná |
| Počet strán: | 48 |
| Jazyk: |
EN
|
| Listinná verzia: | 18,90€ |
| Elektronická verzia: |
a) Bez možnosti tlače, prenosu textu a obrázkov:
17,01€ b) Bez možnosti tlače, s prenosom textu a obrázkov: 18,90€ c) S možnosťou tlače, prenosu textu a obrázkov: 24,57€ |
| Slovenský názov: | Monokryštalické dosky na súčiastky s povrchovou akustickou vlnou (SAW). Špecifikácia a meracia metóda |
| Anglický názov: | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| Dátum vydania: | 01. 07. 2025 |
| Dátum zrušenia: | |
| ICS: | 31.140 |
| Triediaci znak: | 36 8335 |
| Úroveň zapracovania: | idt EN IEC 62276:2025, idt IEC 62276:2025 |
| Vestník: | 06/25 |
| Zmeny: | |
| Nahradzujúce normy: | |
| Nahradené normy: | STN EN 62276:2017-04 (36 8335) |
| Poznámka vo Vestníku: | |
| Predmet normy: | IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development; b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3; c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers; d) The tolerance of Curie temperature ... |
| Náhľad normy: | Náhľad normy (PDF) |