STN EN IEC 62276
| Name: | STN EN IEC 62276 |
| Validity: | Valid |
| Number of pages: | 48 |
| Language: |
EN
|
| Paper: | 18,90€ |
| Electronic version |
a) Only read (without ability to print and copy)
17,01€ b) Without ability to print, with ability to copy (printscreen) 18,90€ c) With ability to print and copy (printscreen) 24,57€ |
| Slovak title | Monokryštalické dosky na súčiastky s povrchovou akustickou vlnou (SAW). Špecifikácia a meracia metóda |
| English title | Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods |
| Release Date: | 01. 07. 2025 |
| Date of withdrawal: | |
| ICS: | 31.140 |
| Sorting character/National clasification code | 36 8335 |
| Level of incorporation: | idt EN IEC 62276:2025, idt IEC 62276:2025 |
| Official Journal | 06/25 |
| Amendments | |
| Replaced by: | |
| Repleces: | STN EN 62276:2017-04 (36 8335) |
| Note in Official Journal: | |
| Subject of the standard: | IEC 62276:2025 applies to the manufacture of synthetic quartz, lithium niobate (LN), lithium tantalate (LT), lithium tetraborate (LBO), and lanthanum gallium silicate (LGS) single crystal wafers intended for use as substrates in the manufacture of surface acoustic wave (SAW) filters and resonators. This edition includes the following significant technical changes with respect to the previous edition: a) The terms and definitions, the technical requirements, sampling frequency, test methods and measurement of transmittance, lightness, colour difference for LN and LT have been added in order to meet the needs of industry development; b) The term “inclusion” (mentioned in 4.13 and 6.10) and its definition have been added because there was no definition for it in Clause 3; c) The specification of LTV and PLTV, and the corresponding description of sampling frequency for LN and LT have been added, because they are the key performance parameters for the wafers; d) The tolerance of Curie temperature ... |
| Preview: | Náhľad normy (PDF) |