STN EN IEC 63616
| Name: | STN EN IEC 63616 |
| Validity: | Valid |
| Number of pages: | 20 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Meranie vodivosti tenkých kovových vrstiev pri mikrovlnových a milimetervlnových frekvenciách. Metóda symetrického kruhového diskového rezonátora |
| English title | Measurement of the conductivity for metal thin films at microwave and millimeter-wave frequencies - Balanced-type circular disk resonator method |
| Release Date: | 01. 04. 2026 |
| Date of withdrawal: | |
| ICS: | 17.220.20, 29.050 |
| Sorting character/National clasification code | 35 3817 |
| Level of incorporation: | idt EN IEC 63616:2026, idt IEC 63616:2025 |
| Official Journal | 03/26 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: | IEC 63616:2025 relates to a conductivity measurement method of thin metal films at microwave and millimeter-wave frequencies. This method has been developed to evaluate the conductivity of a metal foil used for adhering to a substrate or the interfacial conductivity of a metal layer formed on a dielectric substrate. It uses higher-order modes of a balanced-type circular disk resonator and provides broadband conductivity measurements by using a single resonator. |
| Preview: | Náhľad normy (PDF) |