STN EN 60444-2
| Name: | STN EN 60444-2 |
| Validity: | Valid |
| Number of pages: | 12 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Meranie parametrov kremenných kryštálových jednotiek technikou nulovej fázy v pí-článku. Časť 2::Meranie dynamickej kapacitancie kremenných kryštálových jednotiek metódou fázového ofsetu |
| English title | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
| Release Date: | 01. 12. 2000 |
| Date of withdrawal: | |
| ICS: | 31.140 |
| Sorting character/National clasification code | 35 8490 |
| Level of incorporation: | idt EN 60444-2:1997, idt IEC 60444-2:1980 |
| Official Journal | 11/00 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: |