STN EN 60444-3
Name: | STN EN 60444-3 |
Validity: | Valid |
Number of pages: | 19 |
Language: |
EN
|
Paper: | 14,10€ |
Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
Slovak title | Meranie parametrov kremenných kryštálových jednotiek technikou nulovej fázy v pí-článku. Časť 3: Základná metóda merania dvojpólových parametrov kremenných kryštálových jednotiek až do 200 MHz fázovou technikou v pí-článku s kompenzáciou paralelnej (statickej) kapacitancie CO |
English title | Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units |
Release Date: | 01. 12. 2000 |
Date of withdrawal: | |
ICS: | 31.140 |
Sorting character/National clasification code | 35 8490 |
Level of incorporation: | idt EN 60444-3:1997, idt IEC 60444-3:1980 |
Official Journal | 11/00 |
Amendments | |
Replaced by: | |
Repleces: | |
Note in Official Journal: | |
Subject of the standard: |