STN EN IEC 63202-1
| Name: | STN EN IEC 63202-1 |
| Validity: | Valid |
| Number of pages: | 16 |
| Language: |
EN
|
| Paper: | 14,10€ |
| Electronic version |
a) Only read (without ability to print and copy)
12,69€ b) Without ability to print, with ability to copy (printscreen) 14,10€ c) With ability to print and copy (printscreen) 18,33€ |
| Slovak title | Fotovoltické články. Časť 1: Meranie svetelne indukovanej degradácie fotovoltických článkov z kryštalického kremíka |
| English title | Photovoltaic cells - Part 1: Measurement of light-induced degradation of crystalline silicon photovoltaic cells |
| Release Date: | 01. 02. 2020 |
| Date of withdrawal: | |
| ICS: | 27.160 |
| Sorting character/National clasification code | 36 4608 |
| Level of incorporation: | idt EN IEC 63202-1:2019, idt IEC 63202-1:2019 |
| Official Journal | 01/20 |
| Amendments | |
| Replaced by: | |
| Repleces: | |
| Note in Official Journal: | |
| Subject of the standard: | IEC 63202-1:2019 describes procedures for measuring the light-induced degradation (LID) of crystalline silicon photovoltaic (PV) cells in simulated sunlight. The magnitude of LID in a crystalline silicon PV cell is determined by comparing maximum output power at Standard Test Conditions (STC) before, and after, exposure to simulated sunlight at a specified temperature and irradiance. The purpose of this document is to provide standardized PV cell LID information to help PV module manufacturers in minimizing the mismatch between cells within the same module, thereby maximizing power yield. |
| Preview: | Náhľad normy (PDF) |